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1

Error-Correcting Tree Automata for Syntactic Pattern Recognition

Shin-Yee Lu, King-Sun Fu

Journal:

IEEE Transactions on Computers

Year:

1978

Language:

english

File:

PDF, 2.51 MB

english, 1978

2

A Tree-to-Tree Distance and Its Application to Cluster Analysis

Journal:

IEEE Transactions on Pattern Analysis and Machine Intelligence

Year:

1979

Language:

english

File:

PDF, 938 KB

english, 1979

3

Inverse scattering, seismic traveltime tomography, and neural networks

Shin-Yee Lu, James G. Berryman

Journal:

International Journal of Imaging Systems and Technology

Year:

1990

Language:

english

File:

PDF, 570 KB

english, 1990

4

Stochastic Error-Correcting Syntax Analysis for Recognition of Noisy Patterns

Shin-Yee Lu, King-Sun Fu

Journal:

IEEE Transactions on Computers

Year:

1977

Language:

english

File:

PDF, 2.51 MB

english, 1977

5

A Clustering Procedure for Syntactic Patterns

Fu, King-Sun, Lu, Shin-Yee

Journal:

IEEE Transactions on Systems Man and Cybernetics

Year:

1977

Language:

english

File:

PDF, 1.80 MB

english, 1977

6

A Sentence-to-Sentence Clustering Procedure for Pattern Analysis

Lu, Shin-Yee, Fu, King Sun

Journal:

IEEE Transactions on Systems Man and Cybernetics

Year:

1978

Language:

english

File:

PDF, 1.42 MB

english, 1978

7

Waveform Correlation by Tree Matching

Cheng, Yao-Chou, Lu, Shin-Yee

Journal:

IEEE Transactions on Pattern Analysis and Machine Intelligence

Year:

1985

Language:

english

File:

PDF, 1.87 MB

english, 1985

8

[WORLD SCIENTIFIC Proceedings of the 2nd International Conference - Florida, USA (4 – 7 June 1992)] Bioinformatics, Supercomputing and Complex Genome Analysis - EXHAUSTIVE SEARCH OF HOMOLOGOUS REGIONS BETWEEN TWO LARGE DNA SEQUENCES USING AN ENTROPY MEASURE

Year:

1993

Language:

english

File:

PDF, 646 KB

english, 1993

9

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Fiber Optic Materials and Components - Low-cost packaging of high-performance optoelectronic components

Lowry, Mark E., Lu, Shin-Yee, Pocha, Michael D., Strand, Oliver T., Yuce, Hakan H., Paul, Dilip K., Greenwell, Roger A.

Year:

1994

Language:

english

File:

PDF, 222 KB

english, 1994

10

SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - Image cancellation approach to depth-from-focus

Lu, Shin-Yee, Graser, Michael, Svetkoff, Donald J.

Year:

1994

Language:

english

File:

PDF, 870 KB

english, 1994